This is a used Jeol JEM-2200FS TEM electron microscope. Unit was installed  originally in 2012 and was serviced by Jeol during the five years it was at a Federal Government lab.   There are many accessories included that are not shown in the photos and more photos are available on request.  The original manual, CE declaration of conformity and binder of service records is included. The unit appears in near new condition with virtually no scratches or signs of any defects.  The PC, Haskris chiller and roughing pumps are not included. 

• 200kv, 160kv
• Gun: ZrO/W Schottky emitter 
• Resolution: 
• Point image: UHR = 0.19nM, HR =  0.23 nM, HT = 0.25 nm,   CR = 0.27 nM,     HC =  0.31 nM
• Lattice image: UHR = .1 nM, HR = 0.1 nM,     HT = .1 nM,        CR = 0.14 nM,     HC = 0.14 nM
• Modes: TEM, NBD, EDS, CBD
• PS console
• Osaka turbo pump controller for TG390/420M
• (2) Jeol SIP power supplies
• EOS console
  
• Camera
• Gatan Ultrascan 1000
• 894.P07CKP0
• 2k x 2k
• stage controller: Sigma Koki SHOT-204MS
• Piezo supplies: EM-21301 and EM-Z100183PPPC
• holder:  EM-Z100182APPH
• Control panels:
• trackball
• operational panels R1 and L1
• operational panel GC
• Goniometer 2 : EM-Z100181APPS
• Recovery CDs and DVDs

• Utilities required
• cooling water: 7.5l/min
• nitrogen gas
• SF6 gas
• compressed air for air mounts and valves
• floor space required: 16' w x  17.7
• ceiling height: 10.5'