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Condition Desc. used
Manufacturer Jeol
Volts 208
Model JEM-3100F
Amperes 9kva
Serial # EM12600001
Weight 18000
Phase 3

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Jeol STEM Transmission electron microscope JEM-3100F 300kV

Mfg: Jeol

Mdl: JEM-3100F

$225,000.00

Quantity: 1

Inventory #: 9430

Call 610-286-1655 with questions or shipping quotes.
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This is a used JEM 3100F STEM electron microscope system that was installed in 2007 and was used in a lab until 2017 when it was professionally dismantled by Jeol and put into 16 separate crates.  There are many accessories included along with a 2 foot high stack of manuals and all of the service records for the system since it was initially installed.   This JEM-3100F Field Emission STEM Electron Microscope is used for microscopic observation at the atomic or molecular level.  Four illumination modes are possible,  which are TEM, NBD, EDS and CBD.  The electron gun is a ZrO/W(100) emitter with up to 300kV accelerating voltage. 

The main microscope column is in the center of the system with the right and left consoles to the sides and the high voltage generator in the back.  The electron gun is bolted to the top of the microscope column and also connects to the high voltage generator in the rear.  The scope is cooled with a Haskris water chiller.  The main microscope is made by JEOL but there are many ancillary components made by other manufacturers such as Gatan, Oxford and  Haskris.  The Gatan electron energy filter provides  aberration correction with a multi-port, high-speed, high-resolution CCD sensor to capture highly detailed EELS and EFTEM data sets.   Other Gatan products included are the instrumentation bin, the Digiscan II and the STEM controller.   The Oxford products include the TEM 250 energy dispersive spectroscopy system.  There are two PCs, each with many software programs from Gatan, Jeol and Oxford.  Once installed, this system requires utilities such as nitrogen, liquid nitrogen, SF6 gas, cooling water and of course 230V three phase power.   

Most of the components are still packaged in the original crates as shipped from the original government contractor.  The items appear unpacked were previously packed and removed from their packaging for inspection and photos. The main column is the heaviest crate at about 5000lbs and the total of all 16 crates is close to 18000 lbs.  They would all fit in a 40 foot container.

  • 300kV max accelerating voltage with semi-continuous HV control, 100 eV/step minimum.  Electrode short mechanism for operation at 200 kV and 100kv
  • Resolution: 
    • Point image: UHR = 0.17nM, HR =  0.19 nM, HC =  0.26 nM
    • Lattice image: UHR = .1 nM, HR = 0.1 nM, HC = 0.14 nM
  • EM-30145 Field emission gun (FEG)
    • Emitter temp: 1600-1800 deg K
    • Probe current: .65na/1nm (at FWHM)
    • emission method: Zro/W(100)
  • Equipped with electron energy loss spectroscopy (EELS) and EDXS
  • Differential vacuum system utilizing sputter ion and diffusion pumps
  • Eucentric motorized 5 axis side entry Goniometer
  • Ultra high resolution pole piece
    • .17 nm point to point resolution
    • .13 steradian solid angle with 30 mm2 detector
    • .18 steradian solid angle with 50mm2 detector
    • Piezo stage: .04nm step
  • High contrast objective aperture: EM-40080
  • Selectable apertures: open, 20,50,70,150 uM
  • UHR, HR , HC configurations
  • TEM, EDS, NBD, CBD modes
  • Utilities:
    • Nitrogen gas
    • Liquid nitrogen
    • SF6 gas
    • cooling water: 10 l/min
  • JUS-MSI multi-scan interface unit (allows microscope to have two or more independent external control sources)
  • Sheet film system
  • 160mm viewing window
  • Gatan GIF 863 Tridiem – Electron energy filter
    • Combines 3rd order spectrometer aberration correction with multi-port, high-speed, high-resolution CCD sensor to capture highly detailed EELS and EFTEM data sets.
    • 120mRad full azimuth
    • 2k x 2k Ultrascan 1000 FT camera with 4 port.
  • Oxford Inca Energy TEM250
    • energy dispersive x-ray spectrometer, pulse processor, and EDXS analysis system
    • Inca Xstream D6989
    • Inca MICS
  • Gatan Instrumentation bin
  • Gatan Digiscan II – SEM/STEM image acquisition system, digitizes STEM scan ramps and sends to computer via PC daughter board
  • Orius CCD camera controller
  • Gatan Gate valve controller 678-35000
  • Gatan 806 stem detector controller
  • Haskris Chiller
  • UPS unit
  • HT control and resistor
  • Orius Camera 830J49U23
  • Tilt angle controller
  • Biprism power supply and column drive EMZ09441TBP31F
  • Piezo power supply EM-31000FBU
  • Electrode short switch EM-30180
  • Computers
    • Dell 7500 
      • 2011
      • Win 7, 12 GB ram Xeon 2.6 ghz
      • Gatan Digital Micrograph ver 2.31.734.0
      • Jeol 3100 External Server
    • Gray HP compaq
      • Oxford Microanalysis suite 17 +, Inca version 4.07, suite key rev 3, energy TEM250
      • Gatan digital micrograph
  • Software
    • Gatan Microscopy Suite (from packing list)
    • 700.P2000.1 Digital Micrograph
    • Digiscan (688,788)
    • GIF Tridiem (863)
    • 777.U4P STEMpack upgrade to 4 pulse
    • Model 806 HAADF STEM
    • 702.60P Tecnaui Integration
    • 703.30P/703.31P/707.10 EDS Acquistion
    • 703.40P SI STEM EELS
    • 730.00 TEM Tomography
    • 730.15 EFTEM Tomography
    • 730.25 STEM Tomography
    • 707.20 EDS analysis
  • Oxford Inca Aztec ISSUE 2.2 from 201